DCT

1:14-cv-01090

In Depth Test LLC v. Fairchild Semiconductor Corp

General

Filed

08/22/14

Cause of ActionPatent Infringement

SectorSemicond., Optic

StatusClosed

Patent Owner

Operating Company

PACER

CourtD. Delaware

Judge	Period	PO Win Rate
Gregory M. Sleet	08/27/14 - 09/12/18	49%

Magistrate

Mary Pat Thynge

Plaintiff

Party

Name	Ratings
In-Depth Test LLC NPE	L5 E

No Parties

Attorney

Name	Ratings
Farnan LLPLocal	L4 E
Brian E. Farnan	L5 E
Williams Morgan & AmersonLocal	L3 B
Danny L. Williams	L3 A
Christopher N. Cravey	L2 A
Brian K. Buss	L2 B
Matthew R. Rodgers	L2 B
David K. Wooten	L2 C
Friedman Suder & Cooke	L3 E
Corby R. Vowell	L5 E
Jonathan T. Suder	L5 E

No Attorneys

Defendant

Party

Name	Ratings
Fairchild Semiconductor Corp	L4 E

No Parties

Attorney

Name	Ratings
Morris Nichols Arsht & Tunnell LLPLocal	L5 A
Karen Jacobs	L4 A
Jennifer Ying	L3 B
Morrison & Foerster LLP	L5 A
Colette R. Mayer	L3 E
Roman A. Swoopes	-- -- --
Durie Tangri LLP	L5 A
Christopher J. Wiener	L2 B
Potter Anderson & Corroon LLPLocal	L5 A
David E. Moore	L5 A
Richard L. Horwitz	L5 A
Bindu Ann George Palapura	L4 B
Pierce Atwood LLP	L1 D
Robert H. Stier, Jr.	L3 D
Margaret Minister	-- -- --
Kasia S. Park	-- -- --

No Attorneys