US 10,180,386 B2
Mass spectrometry based multi-parametric particle analyzerGeneral
US 10,180,386 B2
Mass spectrometry based multi-parametric particle analyzer
Tech Center:
2800 Semiconductors/Memory, Circuits/Measuring and Testing, Optics/Photocopying, Printing/Measuring and Testing
Examiner:
Andrew Smyth
Art Unit:
2881 Optics
Inventors:
Dmitry R. Bandura; Scott D. Tanner; Vladimir I. Baranov
Assignee:
Priority:
03/25/04
Filed:
02/05/18
Granted:
01/15/19
Expiration:
03/25/24
Abstract
A method for cellular analysis of cellular particles tagged with elemental tags, such as lanthanide-based elemental tags. Particles or element tags associated with particles can be vaporized, atomized, and ionized, such as with an inductively coupled plasma device or a glow discharge device. The vaporized, atomized, and ionized particles or element tags can be analyzed using mass spectrometry, such as using a time of flight mass spectrometer or a magnetic sector mass spectrometer. The amount of at least one element in individual particles can be measured through mass analysis. The amount of many different tags, for example at least five different tags, can be measured at the same time to facilitate multi-parametric analysis of cells and other particles. The vaporized, atomized, and ionized particles or element tags can be pretreated in an ion pretreatment system to filter out low mass ions, such as using a high-pass mass filter or a bandpass mass filter, to allow the elemental tags to pass therethrough.
Cooperative Patent Classification (CPC)
H01H01J49/0431H01JG01N2015/1006G01N