US 12,254,925 B2
Control method and controller of 3D NAND flash
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US 12,254,925 B2
Control method and controller of 3D NAND flash
Tech Center:
2800 Semiconductors/Memory, Circuits/Measuring and Testing, Optics/Photocopying, Printing/Measuring and Testing
Examiner:
Michael T Tran
Art Unit:
2827 Semiconductors/Memory
Agent:
BAYES PLLC
Inventors:
--
Assignee:
YANGTZE MEMORY TECHNOLOGIES CO., LTD.
Priority:
--
Filed:
02/28/24
Granted:
03/18/25
Expiration:
05/06/40
Cooperative Patent Classification (CPC)
G11G11C2211/5621G11C

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