US 7,623,982 B2 | Method of testing an electronic circuit and apparatus thereof

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US 7,623,982 B2

Method of testing an electronic circuit and apparatus thereof

Tech Center:

2800 Semiconductors/Memory, Circuits/Measuring and Testing, Optics/Photocopying, Printing/Measuring and Testing

Examiner:

Edward Raymond

Art Unit:

2857 Printing/Measuring and Testing

Agent:

Intellectual Property Technology Law

Inventors:

Choon Meng Chua; Alfred Cheng Teck Quah; Soon Huat Tan; Lian Ser Koh; Jacob Chee Hong Phang

Assignee:

SEMICAPS PTE LTD.

Priority:

11/05/07

Filed:

11/05/07

Granted:

11/24/09

Expiration:

12/20/27

Abstract

A method of testing an electronic circuit is provided. The method comprises radiating a laser beam onto the electronic circuit, and determining a plurality of samples of a response signal output by the electronic circuit during the period when the laser beam is radiated. The method further comprises accumulating the plurality of samples to generate a value, and generating a test result based on the value.

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