US 8,319,512 B2
FLEXIBLE SUBSTRATE INCLUDING INSPECTION ELECTRODE FOR OUTPUTTING SIGNAL PROCESSED IN INTEGRATED CIRCUIT, ELECTRO-OPTICAL DEVICE, AND ELECTRONIC DEVICEGeneral
US 8,319,512 B2
FLEXIBLE SUBSTRATE INCLUDING INSPECTION ELECTRODE FOR OUTPUTTING SIGNAL PROCESSED IN INTEGRATED CIRCUIT, ELECTRO-OPTICAL DEVICE, AND ELECTRONIC DEVICE
Tech Center:
2800 Semiconductors/Memory, Circuits/Measuring and Testing, Optics/Photocopying, Printing/Measuring and Testing
Examiner:
Vinh Nguyen
Art Unit:
2858 Printing/Measuring and Testing
Inventors:
Katsutoshi Ueno
Assignee:
Priority:
03/12/10
Filed:
03/12/10
Granted:
11/27/12
Expiration:
02/04/31
Abstract
A flexible substrate includes a substrate body; a plurality of lines that are arranged on the substrate body; a plurality of connection terminals that are arranged on an end portion of the substrate body and electrically connected to the respective lines; an integrated circuit that is arranged on the substrate body and electrically connected to at least one of the lines; and an inspection electrode that is arranged on the substrate body and electrically connected to the integrated circuit and capable of outputting a signal processed in the integrated circuit.
Cooperative Patent Classification (CPC)
H05H05K2201/10128H05KG02F1/13452G02FH01L2924/0002H01LG09G2310/0281G09G