US 8,542,880 B2
System and process for roof measurement using aerial imagery
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US 8,542,880 B2
System and process for roof measurement using aerial imagery
Tech Center:
2600 Communications
Examiner:
Atiba O Fitzpatrick
Art Unit:
2668 Digital Cameras; Image Analysis; Applications; pattern Recognition; Color and Compression; Enhancement and Transformation
Inventors:
Dale R. Thornberry; Chris T. Thornberry; Mark F. Garringer
Priority:
05/22/09
Filed:
02/22/13
Granted:
09/24/13
Expiration:
05/22/29
Abstract
Processes and systems are disclosed for determining attributes of a roof structure of real-world three-dimensional building(s), including providing computer input field(s) for a user to input location data generally corresponding to the location of the building, providing visual access to a nadir image of a region including the roof structure of the building; on the nadir image of the region, providing a visual marker that is moveable on the computer monitor around the region, the visual marker initially corresponding to the location data but which may be moved to a final location, having location coordinates, on top of the building to more precisely identify the location of the building roof structure; providing a computer input capable of signaling user-acceptance of the final location of the marker; and, providing visual access to one or more oblique images of an aerial imagery database corresponding to location coordinates of the final location.
Cooperative Patent Classification (CPC)
G01G01B11/28G01BG06T2207/10032G06F3/04815G06V20/176G06T

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