US 8,590,383 B2
Ultrasonic inspection probe carrier system for performing non-destructive testingGeneral
US 8,590,383 B2
Ultrasonic inspection probe carrier system for performing non-destructive testing
Tech Center:
2800 Semiconductors/Memory, Circuits/Measuring and Testing, Optics/Photocopying, Printing/Measuring and Testing
Examiner:
Daniel S Larkin
Art Unit:
2856 Printing/Measuring and Testing
Agent:
Brignac; Jacques L.||Lucas; Robert E.
Inventors:
Jacques L. Brignac; Robert E. Lucas
Assignee:
Priority:
06/24/08
Filed:
06/24/08
Granted:
11/26/13
Expiration:
12/06/31
Abstract
An ultrasonic probe carrier includes a base, a first side arm having a first end thereof attached to the base and a second end thereof extending outwardly from the base on one side of a tube, and a second side arm having a first end thereof attached to the base and a second end thereof extending outwardly from the base on an opposite side of the tube, at least a portion of the first and second side arms being biased towards each other to removably secure the carrier around at least a portion of a circumference of the tube. An ultrasonic probe is attached to the base, and the carrier and ultrasonic probe are rotatable around the tube to scan at least one of: the circumference of the tube and a weld disposed around the circumference of the tube.
Cooperative Patent Classification (CPC)
G01G01N2291/2634G01N